Test & Measurement


Approval for industry-first 3GPP Release 16 protocol conformance test

24 November 2021 Test & Measurement

The Conformance Agreement Group (CAG) operated by the Global Certification Forum (GCF) approved the industry’s first Release 16 Protocol Conformance tests for 5G New Radio (NR) at the CAG#68 meetings held in October – an achievement verified on Anritsu’s 5G NR Mobile Device Test Platform ME7834NR.

Third Generation Partnership Project (3GPP) Release 16 specifications for 5G NR include features which will greatly expand the reach of 5G NR to new industry verticals beyond traditional smartphone and enhanced mobile broadband applications (eMBB). At a broad level, Release 16 introduces enhancements in coverage, power, mobility, reliability and ease in network planning and optimisation.

The conformance tests are defined by 3GPP in TS 38.523-1 and have earlier been verified by Anritsu at 3GPP RAN WG5 (Radio Access Network Working Group 5). These tests have also been submitted to the PCS Type Certification Review Board’s (PTCRB) validation group for approval in upcoming meetings.

The ME7834NR test platform is registered with both the GCF and PTCRB as Test Platform 251. It serves as a test platform for 3GPP-based protocol conformance testing and carrier acceptance testing of mobile devices incorporating multiple radio access technologies. It supports 5G NR in both standalone and non-standalone modes in addition to LTE, LTE-Advanced, LTE-A Pro and W-CDMA.

When combined with Anritsu’s OTA RF chamber MA8171A and RF converters, the ME7834NR covers the sub-6 GHz and millimetre-wave (mmWave) 5G NR frequency bands.


Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

AI-ready rugged spectrum analysis for the field
Vepac Electronics Test & Measurement
The HAROGIC PXR Series is a rugged, benchtop-grade spectrum analyser and an AI-ready open platform in a single portable instrument.

Read more...
Digid announces its nanoscale temperature and force sensors are ready for mass deployment
Test & Measurement
Digid, a pioneer of nanoscale sensing technology, recently announced that its patented printed electronics fabrication technology has been fully qualified for volume production of temperature and force sensors as small as 1 µm long.

Read more...
Multichannel AWGs for GHz signal generation
Vepac Electronics Test & Measurement
Spectrum Instrumentation has introduced its new flagship Arbitrary Waveform Generators with a maximum of 6 channels at 10 GS/s or 12 channels at 5 GS/s output speed.

Read more...
100ZR evaluation added to test instruments
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has added 100ZR coherent optical transceiver evaluation to its portable Network Master Pro MT1040A/MT1000A testers, enabling comprehensive communication performance testing for the next-generation 100ZR standard.

Read more...
Multichannel digitisers
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released new flagship digitisers with 12-bit resolution and a maximum of 6 channels at 10 GS/s or 12 channels at 5 GS/s acquisition speed.

Read more...
Aligning clocks over large distances
ASIC Design Services Test & Measurement
SkyWire technology from Microchip makes it easier to align and compare clocks within nanoseconds across geographic locations.

Read more...
Scalable power solutions up to 3 kW
Accutronics Test & Measurement
GAIA Converter has introduced the MGDM-500/P power module with a new parallel option for scalable power solutions up to 3 kW.

Read more...
New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.

Read more...
Precise DC power analysis
Conical Technologies Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.

Read more...
What is a JTAG connector?
Spectrum Concepts Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved