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Passive intermodulation analyser Passive intermodulation (PIM) is one of the main causes of faults in modern networks. PIM can significantly reduce the network quality with regard to range and data transmission. PIM is caused by a number |
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Vacuum test fixture With its newly designed vacuum test fixtures, Ingun has simplified mass testing of a small number of PCB (printed circuit board) versions. The vacuum test fixture combines intuitive handling and a robust, |
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Optical spectrum analyser Anritsu announced the sales launch of the new MS9740B spectrum analyser which has been developed for evaluating the output characteristics of optical active devices used by optical communications systems. |
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New scan capabilities for EMI receiver Keysight Technologies has added time domain scan (TDS) and real-time scan (RTS) capabilities to the N9048B PXE electromagnetic interference (EMI) receiver, enabling real-time measurements and diagnostics |
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Passive intermodulation analyser Passive intermodulation (PIM) is one of the main causes of faults in modern networks. PIM can significantly reduce the network quality with regard to range and data transmission. PIM is caused by a number |
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Arbitrary waveform generator Tektronix launched the AWG70000B arbitrary waveform generator with new features that enable it to fully support the testing of complex electronic warfare and wireless communications systems that require |
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Battery optimisation software for IoT devices Keysight Technologies has introduced the X8712A IoT device battery life optimisation software solution, to ensure optimal battery life prior to device deployment to accelerate troubleshooting and device |
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Calibration and the challenges of choice A poor or incomplete calibration can lead to significant errors in your measurements. The time to develop a product may exceed your original schedules and production yields may be too low if the test |
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Compact and rugged test fixture ranges In order to offer a compact test fixture solution, Ingun’s manual test fixtures MA 350/F, MA 360/F, MA 260/F and MA 160/F were designed for testing small PCB series. These compact units not only meet |
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Coaxial components for high-frequency testing Anritsu has introduced W1 coaxial components that are metrology-grade designed and manufactured to deliver precision performance and repeatability for high-frequency measurements.
Comprised of a W1 |
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EXFO tests terabit research network EXFO, C Spire and Nokia Bell Labs have collaborated on a demonstration of a terabit-speed research network.
To put it into context, networks running at this speed would make it possible to download |
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Arbitrary function generator Despite their importance in electronics testing and their wide adoption, arbitrary function generators (AFGs) have lagged behind other test instrumentation in terms of usability, making do with small |
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