A new LTE/LTE-Advanced, PXI-based test solution has been introduced by Keysight Technologies to accelerate the setup of multi-channel test system configurations and enable engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.
As multi-antenna designs continue to demand increasingly complex multi-channel test, designing and characterising components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more burdensome. Keysight’s new test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyse multiple channels in the frequency and modulation domains simultaneously.
The easy-to-use graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimised for LTE/LTE-Advanced MIMO and carrier aggregation configurations. A tool is included to configure and route the backplane triggers for proper time synchronisation in MIMO configuration for up to two PXIe chassis.
Time-synchronised MIMO testing (2x2 or 4x4) is easily accomplished using Agilent’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analysers, which provide less than 0,38% EVM and tighter than 20 ns time synchronisation between channels. In addition, up to 160 MHz signal generation and analysis bandwidth are capable of supporting the widest LTE-Advanced carrier aggregation applications.
High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...E-mobility: Navigate safety, interoperability and conformance Concilium Technologies
News
In this whitepaper, these challenges are discussed in more detail and the question is asked: How can EV and EVSE manufacturers navigate a complex regulatory landscape and deliver a quality product, without compromising time-to-market projections?
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
printer friendly version