Manufacturing / Production Technology, Hardware & Services


ML-powered inspection system

EMP 2021 Electronics Manufacturing & Production Handbook Manufacturing / Production Technology, Hardware & Services

Vi Technology’s new NEO platform for the K series 3D AOI (automatic optical inspection) system embeds a machine learning (ML) based technology that drastically reduces the programming time while maintaining its high level of performance and flexibility.

New algorithms based on machine learning technology aim at automating programming tasks through autonomous component recognition and assisted model creation. In practice, it will only take a few clicks to program the inspection of a completely new board containing hundreds or thousands of components.

By combining its latest high-speed laser 3D scanning head with the new smart scene analysis algorithm, the inspection time is up to 50% faster than on the previous generation. The test coverage has been extended with the detection of foreign materials, a component overhang test according to IPC requirements, and a new powerful optical character verification algorithm.


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