New from Linear Technology are three low-power 16-bit, 20 MSps analog-to-digital converters (ADCs) – the LTC2269, LTC2270 and LTC2271 – offering very low input-referred noise and tight integral non-linearity error (INL) for very high-precision DC measurements.
With only 46 μVRMS input noise and maximum guaranteed INL error of ±2,3 LSB, these ADCs are suitable for very low-noise, high-linearity sampling applications such as digital X-ray, infrared and medical imaging, pachymeters, spectrometry and cytometry.
These devices achieve signal-to-noise ratio (SNR) performance of 84 dB and SFDR of 99 dB at baseband. High AC performance and low noise is achieved using a well designed 2,1 Vp-p front end, which also significantly lowers the power required by the ADC driver circuitry.
The ADCs themselves consume approximately 80 mW/channel. Further power savings can be achieved by placing the devices in standby (12 mW) or shutdown (0,5 mW), making them ideal for handheld test and measurement applications.
The LTC2269 and LTC2270 are single-channel and two-channel simultaneous sampling parallel ADCs, respectively, offering a choice of full-rate CMOS or double data rate (DDR) CMOS/LVDS digital outputs with programmable digital output timing, programmable LVDS output current and optional LVDS output termination.
The LTC2271 includes two-channel, simultaneous sampling ADCs with serial LVDS outputs. They include Linear Technology’s digital output randomiser and alternate bit polarity (ABP) mode that minimise digital feedback in the application.
Available in compact QFN packages, designers can benefit from the flexible choice of interfaces to minimise pin count and ease routing to FPGAs.
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