Agilent Technologies has introduced what it claims is the industry’s lowest-priced USB 2.0 signal quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications.
With the new DSOX4USBSQ signal-quality test option, engineers can quickly verify the analog quality of their signals generated by USB hubs, hosts and devices based on USB-IF compliance standards.
Engineers who work with embedded electronics do not usually perform official USB-IF testing, because USB-IF certification is not typically required for non-PC products. However, to ensure reliability, embedded systems designers often test the physical layer of their designs based on USB-IF standards as a ‘reality check’ to ensure signal quality standards are met before releasing their products to production. Agilent’s new USB 2.0 signal-quality test option offers a low-priced way to perform these tests.
The USB 2.0 signal quality test option generates HTML pass/fail reports for eye diagram mask testing, jitter analysis, end-of-packet bit width, signalling rate, edge monotonicity and rise/fall times – all based on official USB-IF algorithms embedded in the oscilloscope.
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