Agilent Technologies recently unveiled the E6607C EXT wireless communications test set, featuring an integrated multiport adaptor for cost-effective, high-volume wireless device manufacturing test.
Optimised for testing multiple devices simultaneously, the EXT-C with integrated multiport adaptor enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1,3x the price.
The EXT-C is an integrated one-box tester that includes a vector signal analyser, vector signal generator, high-speed sequence analyser, eight bidirectional input/output ports for multiformat cellular testing, and four output ports for GNSS testing.
Optimised for the fast-sequenced non-signalling test methods required by the latest wireless modem chipsets, the sequence analyser works in synchronisation with the modem chipset to eliminate signalling overhead and enable multiple measurements from a single acquisition.
Combined with fully calibrated multi-DUT test capabilities, the EXT-C helps manufacturers achieve faster tests and increase yield on the production line. To minimise change in test processes and streamline the transition from R&D to volume manufacturing, the instrument uses the extensive X-Series measurement science available on Agilent spectrum analysers to deliver trusted measurement applications tailored for fast manufacturing test.
The EXT-C can be configured with a variety of X-Series measurement applications for cellular communications, wireless connectivity and digital audio/video, with support for standards such as LTE FDD, LTE TDD, TD-SCDMA and 2G/3G. Individual X-Series measurement applications can be included with the original instrument purchase or added later.
A comprehensive set of complementary software tools to accelerate test development is also available. For example, Agilent Signal Studio makes it easy to create waveforms to generate non-signalling control and test signals with the EXT.
In preproduction, Agilent Sequence Studio enables engineers to quickly create and troubleshoot test plans. And to minimise production code test development, Agilent’s chipset software offers automated calibration and verification for specific wireless chipset modems.
The E6607C is fully backward compatible in terms of functionality with the previous-generation E6607B EXT and E6617A MPA combination. And, in anticipation of future test needs, the EXT-C offers full cellular band coverage up to 3,8 GHz (including LTE TDD Band 43) and support for the fast-sequenced test modes implemented in the latest chipsets.
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