Recently introduced by Agilent Technologies is a metrology option for its PNA family of network analysers that offers national metrology institutes and calibration laboratories an advanced S-parameter measurement solution.
Stability and measurement accuracy are key characteristics metrology laboratories look for in a network analyser. Most solution providers, however, fail to characterise the thermal stability of their instruments. With no specific data on stability, laboratories are unable to determine its impact on resulting measurements.
Agilent’s new metrology option employs a unique technique for accurately characterising the thermal stability of its network analysers, independent of the effects from cables and adaptors. The technique provides 48 hours of stabilisation data that accurately characterises instrument drift stored on the analyser’s hard drive. This data can be used to calculate measurement uncertainty.
In addition, the new metrology option has optimised the raw performance of the PNA family to address the specific measurement needs of metrology laboratories. For example, all front-panel loops were removed to improve stability. The PNA’s raw source match and load match were also optimised. Elevated receiver linearity was realised by specialised hardware techniques based on Agilent’s in-house semiconductor processes.
Agilent’s PNA family of network analysers includes the PNA-L, PNA and PNA-X Series, covering frequencies from 300 kHz to 1,05 THz. The PNA-L is designed for general-purpose network analysis; the PNA is the world’s highest-performing vector network analyser; and the PNA-X provides complete linear and nonlinear component characterisation in a single instrument with a single connection.
The PNA family offers advanced connectivity via LAN, USB and GPIB; an easy-to-use open architecture based on the Microsoft Windows operating system; and an extensive embedded help system. The PNA family’s CPU and operating system can be upgraded as technologies evolve.
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