A new LTE/LTE-Advanced, PXI-based test solution has been introduced by Keysight Technologies to accelerate the setup of multi-channel test system configurations and enable engineers to gain deeper insight into complex carrier aggregation and spatial multiplexing MIMO designs.
As multi-antenna designs continue to demand increasingly complex multi-channel test, designing and characterising components and RF subsystems for base stations, microcells, picocells, repeaters and mobile devices is becoming more burdensome. Keysight’s new test solution provides tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyse multiple channels in the frequency and modulation domains simultaneously.
The easy-to-use graphical user interface shortens the time it takes to set up a test configuration. In addition, measurement setups are optimised for LTE/LTE-Advanced MIMO and carrier aggregation configurations. A tool is included to configure and route the backplane triggers for proper time synchronisation in MIMO configuration for up to two PXIe chassis.
Time-synchronised MIMO testing (2x2 or 4x4) is easily accomplished using Agilent’s RF M9381A PXIe vector signal generators and M9391A PXIe vector signal analysers, which provide less than 0,38% EVM and tighter than 20 ns time synchronisation between channels. In addition, up to 160 MHz signal generation and analysis bandwidth are capable of supporting the widest LTE-Advanced carrier aggregation applications.
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