Test & Measurement


Rugged DAQ controllers

22 July 2015 Test & Measurement

The new CompactDAQ 8-slot controller from National Instruments expands the product range to meet high-channel count applications in rugged environments.

By integrating the processor, signal con-ditioning and I/O into a single CompactDAQ system, engineers can reduce overall system cost and complexity while increasing measure-ment accuracy. Integrated measurement systems reduce the number of components, connections and wiring needed, which often introduce noise and additional costs, to ensure high-accuracy measurements and cost-optimised systems.

Both the 4-slot and 8-slot CompactDAQ controllers feature an Intel Atom dual-core processor that can run either Windows Embedded 7 or NI Linux Real-Time. By pairing industry-standard OS options with LabVIEW system design software, customers can easily port LabVIEW code from existing measurement systems to these new CompactDAQ controllers. They can combine LabVIEW and over 60 sensor-specific I/O modules for CompactDAQ to quickly customise data acquisition systems to meet their application needs.

The controllers feature hot-swappable, removable SD card storage and an integrated CAN/LIN port.

For more information contact National Instruments, 0800 203 199, [email protected], http://southafrica.ni.com





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