Test & Measurement


LabVIEW goes next-gen

14 June 2017 Test & Measurement

At the annual NIWeek exhibition in Austin, Texas, National Instruments unveiled LabVIEW NXG 1.0, the first release of the next generation of the engineering system design software. LabVIEW NXG bridges the gap between configuration-based software and custom programming languages with an innovative new approach to measurement automation that empowers domain experts to focus on what matters most – the problem, not the tool.

“Thirty years ago, we released the original version of LabVIEW, designed to help engineers automate their measurement systems without having to learn the esoterica of traditional programming languages. LabVIEW was the ‘nonprogramming’ way to automate a measurement system,” said Jeff Kodosky, NI cofounder and business and technology fellow, also known as the ‘Father of LabVIEW.’ “For a long time we focused on making additional things possible with LabVIEW, rather than furthering the goal of helping engineers automate measurements quickly and easily. Now we are squarely addressing this with the introduction of LabVIEW NXG, which we designed from the ground up to embrace a streamlined workflow. Common applications can use a simple configuration-based approach, while more complex applications can use the full open-ended graphical programming capability of the LabVIEW language, G.”

The 1.0 release of LabVIEW NXG helps engineers performing benchtop measurements increase their productivity with new non-programming workflows to acquire and iteratively analyse measurement data. These non-programming workflows simplify automation by building the necessary code behind the scenes. For instance, engineers can drag and drop a section of code equivalent to 50 lines of text-based code.

LabVIEW NXG introduces a re-engineered editor with functionality that experienced LabVIEW users often request, but it still offers a user experience similar to complementary software in the market. The refreshed editor further extends the openness of LabVIEW to integrate with a broader set of languages. The modernised editor improves programming productivity by streamlining the editor micro-interactions, user interface objects based on vector graphics and zooming capabilities.

As LabVIEW NXG 1.0 targets benchtop measurements, new capabilities in LabVIEW 2017 target the development, deployment and management of large, complex and distributed test and embedded applications. These include features that enhance interoperability with standard IP and standard communications protocols such as IEC 61131-3, OPC UA and the secure DDS messaging standard.

Whether buying LabVIEW for the first time or having been on an active service contract for years, customers have access to both LabVIEW NXG 1.0 and LabVIEW 2017.

For more information contact National Instruments, 0800 203 199, [email protected], http://southafrica.ni.com





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

AI Experts provide product-specific intelligence
Measuretest Test & Measurement
VIAVI Solutions has announced AI Experts, the first addition to its NITRO AI portfolio of AI-driven capabilities with each Expert providing product-specific intelligence.

Read more...
Rugged spectrum analyser
Vepac Electronics Test & Measurement
The HAROGIC PXR Series is designed for maximum durability and performance in the most demanding environments.

Read more...
Setting a new benchmark for high-power DC load testing
Conical Technologies Test & Measurement Power Electronics / Power Management
The new ITECH IT8900G/L high-speed, high-power DC electronic load offers a powerful combination of speed, scalability, precision and high-power density.

Read more...
Locate underground cable faults faster with the Fluke AF2082 A-Frame
Comtest Editor's Choice Test & Measurement
Underground cable faults can lead to costly downtime, service disruptions, and extensive excavation if the fault location is uncertain. The AF2082 simplifies this process by guiding operators directly to the fault point.

Read more...
Precision power for electronics testing
Vepac Electronics Test & Measurement
The PeakTech 6168 switching power supply is a versatile and reliable solution designed for professional applications in laboratories, development environments, service centres, and training facilities.

Read more...
12-bit 1-wire temperature sensing
RS South Africa Test & Measurement
The DS18B20 digital thermometer from Analog Devices provides 9-bit to 12-bit Celsius temperature measurements in the range -55°C to 125°C.

Read more...
Ultra-fast wideband RF insight
Vepac Electronics Test & Measurement
The Harogix PXE-200 is a high-performance real-time spectrum analyser designed for demanding RF environments up to 20 GHz.

Read more...
Field calibration made easy
Instrotech Test & Measurement
Built around modern component technology, an intuitive interface, and a rugged IP54-rated housing, Instrotech’s Calog series is engineered for the demands of real industrial field calibration work.

Read more...
Rugged two-pole voltage tester
Vepac Electronics Test & Measurement
A key advantage of the PeakTech 1094 is its battery-free operation, ensuring the tester is always ready for use whenever required by professional electricians or maintenance personnel.

Read more...
Rapid IoT prototyping simplified
Future Electronics Test & Measurement
The STEVAL-MKBOXPRO from STMicroelectronics is a compact, ready-to-use wireless development kit designed to accelerate the creation of intelligent IoT and wearable applications.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved