Test & Measurement


Turnkey measurement solution for LTE Cat. M

21 February 2018 Test & Measurement

Anritsu has announced a software release for the MT8870A universal wireless test set to support RF tests of LTE Category M devices. The release includes Category M FDD uplink Tx measurement software (MX887065A), Category M FDD downlink waveform files (MV887065A) and a fully automatic measurement program, providing fast and automatic testing of Tx power, frequency, modulation accuracy, modulation sensitivity, etc. in accordance with the 3GPP LTE Category M RF test specifications.

LTE Category M, a cellular IoT standard included in LTE-Advanced Pro, is a wireless technology based on licence band LPWA (low-power wide-area) in parallel with NB-IoT (narrowband Internet of Things). As well as anticipated smart city and freight tracking applications, it is expected to be adopted by emergency warning systems due to its support for voice communications. But a key issue for a smooth rollout of the service is assuring high mass-production efficiency to help cut terminal costs. The measurement of LTE Category M devices can be automated using a program to control chipsets built into target devices, but, until now, these programs required bespoke development for every customer.

Working closely with chipset vendors to establish measurement technologies for LTE Category M devices, Anritsu has been able to develop a turnkey solution to support auto-mated evaluation at elevated measurement speeds for up to four LTE Category M devices and chipsets without requiring a customer-developed control program.

The MT8870A is a measurement instrument for mass production of various types of wireless communications equipment and modules. Four high-performance tester units are installed in the main unit and each unit supports parallel independent measurement for evaluation of up to four wireless devices and modules. The MT8870A already fully supports 2G/3G/LTE/LTE-Advanced/NB-IoT, WLAN/Bluetooth, GPS and FM evaluations.



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