Test & Measurement


Latest Articles

Multiservice 100G field tester
23 April 2014, Lambda Test
EXFO announced the extension of its Power Blazer offering to cover 10M-to-10G interfaces, and rates including Ethernet, SONET/SDH and OTN. Adding to the modules’ existing 40G/100G capabilities, these ...

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In-circuit debugging probes
23 April 2014, NuVision Electronics
IAR Systems offer a range of in-circuit debugging probes covering different needs from initial to more advanced development. The probes are completely integrated with IAR Embedded Workbench, and targeted ...

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Digital radio test set
23 April 2014, Measuretest
Aeroflex announced the introduction of the new 3920B digital radio test set for analog AM and FM, digital P25, P25 phase II, DMR, NXDN, dPMR, TETRA and TEDS technologies. The test set features a new ...

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High-precision inclinometers
23 April 2014, Accutronics
The Emerald series of low-cost, high-precision inclinometers from Jewell Instruments are designed to have higher accuracy than comparably priced MEMS sensors. The parts are supplied in a rectangular package ...

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Exfo’s high-speed transport modules support CFP2
23 April 2014, Lambda Test
EXFO announced the extension of the FTB/IQS-88100NGE Power Blazer and FTB/IQS-85100G Packet Blazer offerings to cover 100G testing capabilities, including 100G Ethernet (as per IEEE 802.3ba) and OTN (as ...

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Vector network analysers
23 April 2014
Anritsu has expanded its VectorStar family of vector network analysers (VNAs) with the introduction of the MS4640B series. Featuring a number of new measurement capabilities, including PulseView, which ...

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JTAG controller compatible with Agilent ICTs
23 April 2014, ASIC Design Services
XJTAG has released the XJLink2 3070, providing convenient, integrated access to XJTAG’s powerful test and programming tools from Agilent Technologies i3070 ICT (in-circuit testing) instruments. The combination ...

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ScopeCorders add real-time power analysis
23 April 2014
Yokogawa has added two new instruments to its ScopeCorder family of portable multi-channel data-acquisition recorders. The new DL850E and DL850EV (Vehicle Edition) ScopeCorders incorporate a number ...

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Highly integrated wireless test set
2 April 2014, Concilium Technologies
Agilent Technologies is touting its new E7515A UXM wireless test set as the most highly integrated signalling test set created for functional and RF design validation in the 4G era and beyond. The UXM ...

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50 MHz benchtop AWG
2 April 2014, K Measure
K Measure has followed up its recent introduction of a 10 MHz benchtop arbitrary waveform generator (AWG) with a new instrument for applications requiring more speed. The SDG1050 from Siglent can generate ...

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New coating keeps spring probes clean
2 April 2014, Sivan Electronic Supplies
Aries Electronics has introduced Protect-A Probe, an anti-diffusion gold coating, for its complete line of burn-in and test socket spring probes.    The coating is designed to lessen or eliminate the ...

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Optical sampling oscilloscope
12 March 2014, MANTECH
The new PicoScope 9321 sampling oscilloscope integrates a 9,5 GHz optical fibre-to-electrical converter with a two-channel, 20 GHz PC sampling oscilloscope. This extends Pico Technology’s serial data ...

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Three-phase power quality recorder
12 March 2014, Comtest
The Fluke 1750 three-phase power recorder automatically records every power quality parameter and event, on every cycle continuously for applications as diverse as long-term analysis to uncover hard-to-find ...

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Agilent updates instrument control software
12 March 2014, Concilium Technologies
Agilent Technologies announced the newest version of its Command Expert software for faster and easier instrument control in many test application development environments. This release includes support ...

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Arbitrary waveform generator
12 March 2014, K Measure
One of the most popular pieces of test equipment on the desks of most electronic engineers and technicians is a function generator or the more modern variant, an arbitrary waveform generator (AWG). The ...

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Bit error rate tester
12 March 2014, Concilium Technologies
Agilent Technologies introduced the M8000 Series BER test solution, a highly integrated and scalable bit error ratio test solution for physical-layer characterisation, validation and compliance testing ...

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Palm-sized oscilloscopes
19 February 2014, MANTECH
Pico Technology has released a new range of PicoScope 2000 oscilloscopes that occupy roughly the area of a passport and are only 19 mm thick. Connected to and powered from a USB port, they offer bandwidths ...

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Optical fibre inspection probe
19 February 2014, Lambda Test
The EXFO FIP-400B is a next-generation inspection probe providing crisp, digital images of optical connectors at three levels of magnification. Featuring an ergonomic design, this probe is optimised for ...

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Temperature and humidity logger
19 February 2014, K Measure
For those applications where one needs to log temperature and humidity over a long period of time (eg, monitoring a generator or server room or logging environmental data while testing electronic products), ...

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Microwave analog signal generators
19 February 2014, Concilium Technologies
Agilent Technologies has expanded its range of signal generators with two new models that provide enhanced performance in phase noise, output power and frequency-switching speed. Complementing the company’s ...

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