Test & Measurement


NI's bus interface software products add USB support

27 August 2003 Test & Measurement

National Instruments' NI-Device Version 1.4 and NI-VISA Version 3.0 bus interface software products now support USB. Instrument developers can use NI-Device 1.4 bus interface software to create USB firmware in addition to GPIB and Ethernet firmware for their ANSI/IEEE Standard 488.2 devices.

NI-Device handles most of the IEEE 488.2 protocol requirements for the instrument developer. The software abstracts the communication bus from the instrument-specific firmware so that instrument developers can create bus-independent firmware that adapts to new communication buses while preserving their firmware investment. NI-Device 1.4 enables instrument developers to write firmware for any instrument that runs a Windows 2000/NT/XP/Me/98 operating system when the connectivity interface support is through an NI PCI-based GPIB interface, the NI PCI-8212 GPIB/Ethernet interface or the new NI PCI-8215 GPIB/USB interface. NI-Device 1.4 is also offered in a DDK source-code package for support on non-Windows operating systems.

Engineers can use NI-VISA 3.0 bus I/O software to communicate with instruments that support USB in addition to GPIB, Serial, VXI, PXI and Ethernet. NI-VISA bus I/O software is a comprehensive software package for configuring, programming and troubleshooting USB, GPIB, Serial, VXI, PXI and Ethernet systems. It features a complete set of high-performance routines for industry-standard programming environments and intuitive debugging tools. NI-VISA 3.0 software works with NI LabVIEW, LabWindows/CVI, Measurement Studio and TestStand as well as NI GPIB, VXI and PXI hardware.





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.

Read more...
High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...