Test & Measurement


New RF centre probe test sockets

10 September 2003 Test & Measurement

Aries Electronics offers a high frequency centre probe socket that features a floating guide plate with a built-in hard stop to help protect the probes during rest, and eliminating damage to the package leads. The new test socket, ideal for automated handler testing, can be used for packages with a pitch of 0,50 mm or higher for devices up to 55 mm wide in applications with speeds from 1 GHz to over 10 GHz.

The decoupling pockets of the centre probe test socket can be placed within 1,0 mm of the probes. This allows the customer to place biasing or decoupling components right next to the probes, resulting in less noise and faster test time. For quick and easy mounting on and removal from the load board, the socket features solderless, pressure-mount compression spring probes, accurately located by two moulded plastic alignment pins and secured with four stainless steel screws.

Aries Center Probe contacts have a cycle life of over 500 000 and can handle up to 2 A of continuous current. Precisely machined from Torlon 4203 or 5530, the socket can be used at operating temperatures from -55 to +150°C. The RF test socket is available in custom materials, platings, sizes and configurations to suit specific customer handler interfaces.



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