Computer/Embedded Technology


HALT test program ensures embedded products completely reliable

11 February 2004 Computer/Embedded Technology

In order to maximise product reliability and durability, embedded solutions provider, Ampro, subjects its new designs to a comprehensive highly accelerated life test (HALT) program during its product development process. The objective of the test program is to provide stressing to new designs - far in excess of those expected during normal operation - thereby determining the operational and destruct limits of the designs under test. This empirically determines the thermal and vibration margins of the design as well as identifies weak elements in the design or manufacturing process, providing an opportunity to implement design improvements that increase reliability of the design.

HALT is a series of stresses designed to methodically evaluate the design limits of the product. The process consists of progressively increased extremes of temperature (both high and low), rapid thermal transition, six-axis vibration, and, finally, combined temperature and vibration stress. At each stress dwell extreme, power to the unit is margined at ±5%. In each test, stress is progressively increased while the unit is operating in a continuous functional test loop that exercises key subsystems such as the CPU, I/O ports, disk controllers, and video. If a failure is detected, it is evaluated, immediate fixes are made, and the test is continued until destruct limits are reached. Failures and the physical damage found at the destruct limits provide data which is used to improve the product design.

Typical extremes encountered during HALT testing are:

* Thermal: -100 to +150°C.

* Rapid thermal transition: -50 to +100°C at a rate of 70°C per minute.

* Vibration: 50 g r.m.s. broadband random vibration over six axes simultaneously.

A final long-term benefit is achieved when HALT data is used to develop highly accelerated stress screens (HASS). HASS is performed on production units, on a sampling basis to continuously monitor the stability of the manufacturing processes. This provides an empirical basis for long term reliability enhancements throughout the product's production life.



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