Test & Measurement


Application allows logic analysers to measure 64 FPGA signals/pin

6 October 2004 Test & Measurement

Agilent has introduced what it claims is the industry's first commercially available dynamic probe application for logic analyser-based debug of field programmable gate arrays (FPGAs). Its B4655A FPGA dynamic probe logic-analysis application can yield significant productivity improvements for engineering teams debugging Xilinx FPGAs, including the Virtex-II, Virtex-II Pro and Spartan-3 families.

The probe application interacts with an on-chip virtual probing technology to enable logic analysers to measure up to 64 internal FPGA signals for each debug pin compared to traditional logic analysers, which measure a single internal FPGA signal for each debug pin. The application enables engineers to select new groups of internal signals to probe without requiring time-consuming design recompiles.



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