Test & Measurement


Reflectometer has dual-wavelength capability

3 November 2004 Test & Measurement

Fast, reliable testing of virtually all premises and campus fibre networks - including CCTV and legacy installations - is easy with the new XC8513 dual-wavelength cross-checking reflectometer according to its manufacturer, Megger.

Like the company's popular XC850 single-wavelength model, the XC8513 brings the benefits of optical time domain reflectometry (OTDR) to data networks, without the complexity and cost usually associated with OTDR testing solutions.

It has the ability to measure at both 850 nm and 1300 nm. When used at 850 nm, the XC8513 measures all connector and fibre losses, and shows faults, such as macrobends, indicating the position of fibre features to within 0,5 metre. Operation at 1300 nm is useful when it is necessary to measure the fibre loss for links operating at this wavelength, which is predominantly used for fibre backbones and in CCTV installations. The instrument stores the results for use in reports, and also indicates the cause and precise location of fibre features, allowing faults to be located much more easily than with a conventional light source and optical power meter.

The XC8513 is a duplex instrument, and measures both fibres of a duplex link automatically without reconnection. It may also be used in simplex or duplex-loopback mode, where its high dynamic range of <16 dB is essential. At 850 nm, the XC8513 can be used on fibre segments up to 2 km long, and typical event dead-zone performance is two metres at 850 nm. At 1300 nm, the typical dead zone is eight metres.

The time taken to power the instrument, make a measurement, and store it is less than 30 seconds, claims Megger. The operator is guided through the basic sequence by following highlighted soft keys. Operator preferences can be entered using the instrument's menu system, or they can be set up on a PC, and loaded into the XC8513 via a plug-in memory card.

Megger offers the XC8513 in two versions. The XC8513ST features a bright back-lit colour display, and offers an economical choice where the instrument will be used primarily indoors, while the XC8513SSR has a transflective colour display which is equally easy to read indoors and in bright outdoor light. Both versions include a full alphanumeric keyboard and also support data entry via an external bar code scanner. Configuration data, test identification data, and measurement traces are stored on removable memory cards, as well as in standard CSV format.

The XC8513 is suited for the harsh reality of site installation, and is designed to be splash-proof, dust-proof, and is rubber-armoured. Battery capacity exceeds ten hours of use.





Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...
Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.

Read more...