Test & Measurement


Universal instrument for dynamic measurements

18 May 2005 Test & Measurement

Design and test engineers can now use a single modular instrument to make a wide range of dynamic measurements with the new National Instruments flexible resolution digitiser. Just as the digital multimeter brought universal measurement capability to DC measurements, NI says that its PXI-5922 flexible resolution digitiser revolutionises dynamic measurements with a universal measurement device. Engineers can combine the module with NI LabVIEW 7.1 to create numerous types of instruments, such as AC voltmeters, audio analysers, frequency counters, spectrum analysers or I/Q modulation analysers, that often exceed the measurement performance of high-end traditional instruments with similar functionality.

Unlike traditional measurement devices that have a fixed resolution for all sample rates, this digitiser uses the NI FlexII ADC that has flexible resolution and can sample from 16 bits at 15 Msps to 24 bits at 500 Ksps. The NI FlexII ADC incorporates proprietory methods for reducing the linearity and temperature drift errors inherent to multibit sigma-delta converters. It achieves large dynamic range at high sample rates and low noise. Low-level signals can thus be directly digitised without the need for external signal conditioning, such as filters and low-noise amplifiers.

The NI PXI-5922 module is suited for a wide range of applications. It can be used to characterise and test the latest high performance DACs. In precision audio applications, its ability to acquire signals with 24-bit resolution at up to 500 Ksps means engineers can capture high-order harmonics with wide dynamic range. The module's 18-bit resolution at 10 Msps makes it an excellent digitiser for acquiring baseband I/Q signals used in digital communications systems.

For more information contact National Instruments South Africa, 0800 203 199.





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