Test & Measurement


Fault-finding system is fast and flexible

24 August 2005 Test & Measurement

Fault coverage and return on investment; two major factors affecting the choice of a test system in today's competitive markets. Combine these with the flexibility to adapt as technology advances and you have the blueprint for the most desirable test system on the market.

The PinPoint II fault-finding family from Diagnosys offers superior fault coverage and good return on investment. As well as saving time through increased productivity, the manufacturer says that it also saves on cost, and in today's competitive market that is an important factor when it comes to choosing the right test solution.

PinPoint II has been engineered to be extremely fast and flexible, with the ability to detect and isolate more faults faster. In-circuit functional test (both analog and digital) edge card functional, VI analysis, boundary scan, PXI test, GPIB test and schematic reverse-engineering are tests all possible through the PinPoint II family.

Connectivity is also a key factor in choice of test equipment and this is another area in which the PinPoint II excels. The combination of device clips, edge connection and bed-of-nails fixturing possible, means that it can connect to virtually any board.



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