Test & Measurement


New high speed serial pulse data generator

24 August 2005 Test & Measurement Security Services & Risk Management

Agilent Technologies has introduced what it says is the industry's first high-speed, serial pulse data generator with stimulus capability up to 7 GHz, enabling computer and semiconductor test engineers to accurately characterise components being developed for the next-generation serial busses used in high-speed transmission systems.

According to Steve Alves, MD of local distributor, Concilium Technologies, the accurate high-speed stimulus is crucial in ensuring signal integrity. "For the first time the new Agilent 81141A allows engineers to conduct reliable and accurate physical layer tests by providing precision low-jitter signals and offering full control of data streams for stress tests."

The 81141A's linear delay modulation enables fast and ultra-precise jitter tolerance and jitter transfer measurements.

"The combination of multiple data formats such as RZ, R1 and NRZ with sequencing, trigger capability and high-speed frequency is unique in the market and critical for the next-generation high-speed technology wave," says Alves.

"High-speed design starts with the physical layer and its signal integrity."

Versatility, high quality and the most precise data signals are the key contributions of the 7 GHz pulse data generator. Other features include: The data formats RZ, R1 and NRZ, with flexible parameters and fast transition times for high-quality waveforms and eye diagram measurements.

"Pattern and sequence capabilities enabling stimulus signals for the entire range of digital high-speed serial buses are offered, while linear delay modulation up to 1 GHz is possible for jitter tolerance testing," concludes Alves.

For more information contact Steve Alves, Concilium Technologies, +27 (0)12 678 9200, [email protected]



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