Test & Measurement


Test tool lowers the cost of high-performance RF analysis

25 January 2006 Test & Measurement

Concilium Technologies and Agilent Technologies noted that installation and maintenance companies were continually pressured to minimise test costs, while needing to make more precise measurements on more complex equipment.

Agilent's latest compact, high-performance spectrum analyser series can be the answer to ease this pressure, as it provides industry-leading performance features and usability in a low-cost, portable package, says the local distributor, Concilium Technologies. This allows engineers to achieve high measurement confidence more cost effectively than ever before. The Agilent CSA spectrum analyser provides one of the best amplitude accuracy and achievable dynamic range for testing in this price class, it says.

"Agilent has led the market in spectrum analysis right from the early days by producing instruments that are accurate, repeatable and rugged. They have now managed to enhance this proud record in a low cost package with the introduction of the CSA family," says Steve Alves, MD of Concilium Technologies.

Alves says that the Agilent CSA provides:

* Flexibility, by allowing users to easily and accurately characterise single-and dual-port devices. Its small form factor, low weight and battery operation makes it suitable for field maintenance or bench use. In addition, the Agilent CSA's card slot architecture enables future performance and capability enhancements.

* Ease of use through minimal training and set-up, automated tuning, scaling and ranging, and the highest-resolution display in its price class. These capabilities speed the time and lower the cost of test.

* Modern connectivity, such as use of a USB memory stick for installing new firmware, simplifies test tasks. As part of the Agilent Open program, which provides system-ready convenience and flexible connectivity, the analyser uses standard commands to easily integrate into existing systems for expansion or upgrades.



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