Test & Measurement


Industry-first event identification software and new low-noise scope

24 January 2007 Test & Measurement

Said to be the industry′s first event identification software and the industry′s lowest-noise oscilloscope, Agilent Technologies′ 80000B Series also incorporates next-generation MegaZoom technology, pioneered in the company’s previously-announced Infiniium 8000A Series and the 6000A Series scopes.

According to local distributor, Concilium Technologies, each model of the Infiniium 80000B series offers the industry's lowest noise floor at its particular bandwidth, while additional signal integrity advantages include the industry's lowest jitter measurement floor, lowest trigger jitter and flattest frequency response. The unique bandwidth upgradeability of the Infiniium 80000B Series allows engineers to select the appropriate bandwidth needed for their particular application today, and then upgrade oscilloscope performance later for a more advanced project.

"The controlled impedance transmission lines in every probe head minimises mismatch and loading when probing thereby preserving the signal characteristics not possible with more traditional probing accessories," says Andrew Lees, internal sales team leader for Concilium Technologies. "The superior signal fidelity maximises engineer's design margin by not compromising measurement accuracy due to the poor noise, jitter or frequency response of the scope or probing system."

"Agilent not only delivers industry-leading oscilloscope performance, but also uses its extensive technology base to provide superior signal integrity and probing and analysis software for the designer's specific application," says David Churchill, vice president and general manager of Agilent's Design Validation Division. "In addition, Agilent is redefining the investment paradigm for multigigahertz oscilloscopes by offering the industry's only bandwidth-upgradeable series of oscilloscopes."

The Infiniium oscilloscopes have been further enhanced via the addition of a touch-screen, an XGA resolution display, a front-panel USB port, and a higher-performance CPU system for even faster display and measurement execution. The Infiniium 80000B can be used with the Agilent InfiniiMax probing system, which offers a large selection of high-speed probes. Also, the 256 levels of intensity grading with MegaZoom clearly identifies waveform anomalies that were previously invisible with earlier-model oscilloscopes, says the company.

Infiniium application software is available for the 80000B Series. There are 23 application packages vital to engineers designing high-speed serial buses, RF and wireless products, and other ultra-high-speed electronics. The first event identification software allows digital designers who use Infiniium oscilloscopes to quickly and easily identify signal integrity issues found in electronic designs and it works scanning through thousands of acquired waveforms per second and then isolating anomalous signal behaviour.

InfiniiScan identifies signal integrity issues that were previously difficult or impossible to find with traditional hardware triggering or deep memory approaches. With InfiniiScan, digital designers can monitor up to five different events or the same event on four channels simultaneously. The software can also isolate events as narrow as 70 ps, well beyond the 300 ps limitation of hardware-based approaches. There is no need to manually inspect waveforms; InfiniiScan scans waveforms automatically and is able to identify a single waveform anomaly out of 10 000 screens of data without requiring programming.



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
E-mobility: Navigate safety, interoperability and conformance
Concilium Technologies News
In this whitepaper, these challenges are discussed in more detail and the question is asked: How can EV and EVSE manufacturers navigate a complex regulatory landscape and deliver a quality product, without compromising time-to-market projections?

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...