Tektronix has announced several new features and enhancements for its award winning DPO7000 Series and the DPO/DSA70000 Series realtime oscilloscopes.
The new capabilities provide unimpaired signal representation, as well as accurate timing and amplitude measurements. The new capabilities are aimed at easing the testing of high-speed serial data buses such as PCI-Express, SATA and HDMI.
The new and enhanced capabilities assist design engineers in defining, developing and testing complex computing, video, communication and data acquisition equipment. Key additions include: Bandwidth Limit Selection to control the noise floor; an advanced acquisition solution through enhanced bandwidth to the probe tip using DSP; Pattern Lock Triggering; and Event Search and Mark. Taken together with existing capabilities of the platform, the DPO/DSA70000 Series provides a highly accurate 4-channel realtime oscilloscope and fast, complete debug capability.
Bandwidth limit selection
The DPO7000 and DPO/DSA70000 Series oscilloscopes include as standard a series of user-selectable bandwidth limit filters that preserve the basic roll-off characteristics, flatness, and phase linearity of the instrument within the new frequency range, reducing the effects of out-of-band noise on the measurements. Design engineers can purchase one instrument for their highest bandwidth needs and optimise it to handle lower-frequency measurements equally well by adjusting the maximum bandwidth in 1 GHz increments down to 500 MHz. The new limited bandwidth is also available at sample rates above the maximum realtime sample rate, and is selectable independently on all four channels.
Bandwidth enhancement to the probe tip
DSP filtering has been added and complements the acquisition engine, providing reliable timing and amplitude resolution and accuracy down to the probe tip for most Z-active probes (P7380, P7380SMA, P7313, P7313SMA, and P7360) and new P7500 TriMode probes. This optimises the complete acquisition system performance for best response, enabling engineers to test up to the full bandwidth of the oscilloscope and probe combination with enhanced signal fidelity. This feature is available at sample rates above the maximum realtime sample rate and is selectable independently on all four channels.
Pattern lock triggering
Pattern lock adds a new dimension to pattern triggering at data rates up to 6,25 Gbps NRZ or 8b/10b with internal clock recovery, by enabling the oscilloscope to take samples at specific locations in the data pattern with high time-base accuracy. This feature accurately and repetitively captures an entire NRZ test pattern for in-depth analysis. Pattern lock triggering may be used to build up an eye diagram from samples taken sequentially through the data pattern. This maintains a specific timing relationship between samples and allows the oscilloscope to draw the eye based on specific bit trajectories.
Event search and mark
This ability enables an engineer to search through a long acquisition and automatically mark all occurrences of a specified event. The user can even view the search results as an event table rather than viewing them one at a time on the waveforms themselves, providing rapid debugging of faults in complex signal structures. A basic event (edge-only) search and mark is provided standard; nine more advanced event types are provided with the ASM option (Advanced Event Search and Mark).
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