Test & Measurement


Contact for leadless device testing

4 March 2009 Test & Measurement

IDI has released its new patent pending Synergetix Dyno contact for the test of QFNs, MLFs and other leadless devices.

The Dyno test socket employs an innovative wiping contact design that ensures low and consistent contact resistance and higher first pass yields in harsh and demanding applications. The key advancement of this new contact is its monolithic design which scrubs across the surface of the device lead, penetrating even the most tenacious contaminants through hundreds of thousands of insertions. Because of its design, the contact is nearly self-cleaning, requiring only minimal intervention over its lifetime of 500 000 cycles.

The Dyno contact, now available for use in Synergetix test sockets, features contacts plated with IDI’s Endura plating process, known for resistance to intermetallic contamination in lead-free device testing. It is compatible with most existing offset load boards and in tests has demonstrated contact resistance under 20 mW when tested against a matte-tin device.



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