Test & Measurement


High-energy test probes

20 January 2010 Test & Measurement

Ingun has developed the new e-type series of high-energy probes to provide high contact reliability and avoid additional stress when contacting printed circuit boards. The e-type is available in common grids (50, 75, 100 mil) and is compatible with Ingun’s standard series GKS-050/075/100/422, featuring identical maximum stroke of 6,4 mm. The new probes are available in numerous tip styles.

The increased contacting reliability of the e-type series is based on their special performance with up to 100% higher spring force during initial contacting of the surface of the PCB. This additional contacting energy ensures up to 25% larger contacting area of the test probe on the PCB. The additional contacting reliability does not, however, increase the stress on the target board, since only the pre-load of the spring is increased and the spring-force at working stroke remains the same.



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