XJTAG recently released its second generation boundary scan solution, the XJTAG XTR series. This includes all the features of the XJTAG development system plus lots of new features and usability enhancements, from support for multiple JTAG chains to the ability to measure supply rail voltages and signal frequencies. These features are designed to save developers, test engineers, OEMs and contract manufacturers time and money, and reduce the amount of test equipment required during production testing and board bring-up.
The XTR series supports multiple JTAG chains – with up to four test access port (TAP) connections available to a target board. Also available with the new series is the ability to measure up to 18 different voltages. This is an important addition as modern boards often feature numerous supply rails, so the ability to measure their different voltages, before and during JTAG testing, is very useful for ensuring stable circuit operation. The new release also boasts a JTAG interface that can accurately measure clock signal frequencies with an accuracy of 10 ppm up to 200 MHz. This is particularly useful when clock sources are present on a target board.
XJTAG has also introduced features to improve laboratory and field work by making it possible to start the test procedure remotely. This is done by using the button on the new XJLink2 adapter, which conveniently includes three LEDs to give the user a visual indication of the system status. The XJLink2 is also available to order in two colours so that users can use this to differentiate between units with different licences. Also new is the ability to run the JTAG TCK signal at up to 166 MHz, as well as adjustable signal termination, improved automatic signal skew control and support for running within a virtual machine (eg, under VMWare). Improvements have also been implemented to XJDeveloper, XJRunner and XJEase to support the new features.
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