Test & Measurement


LeCroy gains lead in oscilloscope bandwidth

27 October 2010 Test & Measurement

LeCroy’s new line of WaveMaster 8Zi-A digital oscilloscopes now provides up to 45 GHz of bandwidth and 120 GSps sample rate – said to be the world’s highest bandwidth and fastest sample rate real-time oscilloscope – combined with 768 Megapoints of analysis memory.

Additionally, the introduction of a model with 20 GHz of true analog bandwidth on four channels provides high performance and signal fidelity on four measurement channels. On all models, acquisition capability can be doubled with the use of the Zi-8CH-SYNCH oscilloscope synchronisation kit, with all acquired channels displayed on a single display grid.

The standard sample rate is 120 GSps for 45 GHz bandwidth, 80 GSps for 25 to 30 GHz bandwidths, and 40 GSps on all four channels at 20 GHz bandwidth. For 4 to 20 GHz bandwidths, the standard sample rate is 40 GSps on all four channels with an option to increase the sampling rate to 80 GSps on two channels. All memory is available at full record lengths for analysis processing, 20 Mpts/ch is provided standard, with memory options up to 256 Mpts/ch available. In 120 and 80 GSps mode, memory can be interleaved to 768 and 512 Mpts/ch.

The jitter timing and analysis (JTA2) toolkit and XDEV advanced developer’s toolkit are now standard in the eight Zi-A models. The JTA2 toolkit contains several powerful tools, such as Track, which provides a graphical plot of a measurement parameter vs. time, and Histogram, which provides a graphical statistical view of measurement statistics. Track is especially helpful to understand measurement or jitter parameter variations over time; it can be used to the full record length of the oscilloscope, allowing millions of measurements to be measured and graphed over very long periods of time. The XDEV toolkit allows customised integration by permitting an engineer to create and run custom math and measurement algorithms written in MATLAB, C/C++, Excel, Visual Basic Script (VBS) or JAVA script to be inserted into the oscilloscope processing stream with a result returned on the oscilloscope display and available for further analysis and processing.

For serial data applications, nine new serial data analyser (SDA) models from 4 to 45 GHz with similar sample rate and analysis memory capability are combined with LeCroy’s SDA II serial data analysis tools and standard serial trigger to provide capability for implementing and debugging emerging, high-speed serial data standards, such as PCIe 3.0 and USB 3.0.

The Eye Doctor II signal integrity toolkit provides capability for cable and test fixture de-embedding, modelling of pre-emphasis and de-emphasis, serial data channel emulation and serial data receiver equalisation. It is possible, within the scope environment and on full record lengths, to compensate for or emulate signal path effects and serial data receiver equalisation so as to precisely measure waveforms with the highest signal fidelity at any place in the test circuit under any test condition.

LeCroy provides a range of high-bandwidth probes and differential amplifiers up to 25 GHz bandwidth. The WaveLink differential probes are available in 13, 16, 20 and 25 GHz models with browser positioner tip and solder-in lead, and are distinguished by high bandwidth solder-in lead (25 GHz), low noise and high mid-band impedance.

For more information contact Comtest, +27 (0)11 608 8520, [email protected], www.comtest.co.za



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

AI Experts provide product-specific intelligence
Measuretest Test & Measurement
VIAVI Solutions has announced AI Experts, the first addition to its NITRO AI portfolio of AI-driven capabilities with each Expert providing product-specific intelligence.

Read more...
Rugged spectrum analyser
Vepac Electronics Test & Measurement
The HAROGIC PXR Series is designed for maximum durability and performance in the most demanding environments.

Read more...
Setting a new benchmark for high-power DC load testing
Conical Technologies Test & Measurement Power Electronics / Power Management
The new ITECH IT8900G/L high-speed, high-power DC electronic load offers a powerful combination of speed, scalability, precision and high-power density.

Read more...
Locate underground cable faults faster with the Fluke AF2082 A-Frame
Comtest Editor's Choice Test & Measurement
Underground cable faults can lead to costly downtime, service disruptions, and extensive excavation if the fault location is uncertain. The AF2082 simplifies this process by guiding operators directly to the fault point.

Read more...
Precision power for electronics testing
Vepac Electronics Test & Measurement
The PeakTech 6168 switching power supply is a versatile and reliable solution designed for professional applications in laboratories, development environments, service centres, and training facilities.

Read more...
12-bit 1-wire temperature sensing
RS South Africa Test & Measurement
The DS18B20 digital thermometer from Analog Devices provides 9-bit to 12-bit Celsius temperature measurements in the range -55°C to 125°C.

Read more...
Ultra-fast wideband RF insight
Vepac Electronics Test & Measurement
The Harogix PXE-200 is a high-performance real-time spectrum analyser designed for demanding RF environments up to 20 GHz.

Read more...
Field calibration made easy
Instrotech Test & Measurement
Built around modern component technology, an intuitive interface, and a rugged IP54-rated housing, Instrotech’s Calog series is engineered for the demands of real industrial field calibration work.

Read more...
Rugged two-pole voltage tester
Vepac Electronics Test & Measurement
A key advantage of the PeakTech 1094 is its battery-free operation, ensuring the tester is always ready for use whenever required by professional electricians or maintenance personnel.

Read more...
Plug-in timing module
Comtest Computer/Embedded Technology
Microchip’s MD-990-0011-B timing module redefines the role of timing, making it possible for customers to seamlessly integrate advanced synchronisation at any stage of development.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved