Agilent Technologies’ new B2900A series is the company’s first line of compact benchtop source/measure units (SMUs) for testing of semiconductors, components and materials. They provide wide voltage/current ranges and an intuitive graphical interface with colour displays. The instruments are designed for fast, simple current-versus-voltage (I-V curve) characterisation of semiconductors, active/passive components and materials in research, development, manufacturing and education applications.
The SMUs’ voltage range is 210 V while current ranges are 3 A d.c. and 10,5 A pulsed. They boast minimum resolution of 100 nV and 10 fA. The intuitive user interface is presented on a 4,3-inch colour LCD screen that supports graphical and numerical displays in single, dual, graph and roll views. The units also archive 12 500 readings per second (maximum sweep-operation reading rate, source/measure to GPIB). Under programmatic control, they support the SCPI command set, enabling basic compatibility with – and easy migration from – conventional SMUs.
The B2900A series consists of four models: the one-channel B2901A and B2911A and the two-channel B2902A and B2912A.
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