Texas Instruments has introduced new high-performance, low-cost evaluation boards for evaluating high-speed data converters. The TSW1400EVM data capture and pattern generation board evaluates up to 16-bit analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). It costs 75% less than the previous generation, while providing twice the memory.
Additionally, the TSW1405EVM for pattern capture and the TSW1406EVM for pattern generation provide simple and low-cost platforms for quick evaluation of TI data converters.
The TSW1400EVM provides a complete system to capture and evaluate data samples and to generate and send desired test patterns to DAC evaluation modules (EVMs) via an intuitive graphical user interface (GUI). It includes 1 GB of memory, enabling 512-M sample depth for high fast Fourier transform (FFT) resolution and capturing large data frames for demodulation analysis. The board is compatible with CMOS- and LVDS-interface ADC and DAC EVMs, while supporting up to eight simultaneous-channel analyses. It supports up to 1,5 GSps LVDS I/O rates for both ADCs and DACs, enabling use with most TI ADC and DAC EVMs at maximum interface and sample rates.
The TSW1405EVM and TSW1406EVM provide simple pattern generation for 16-bit LVDS ADCs and DACs with up to 64K sample depth via an easy-to-use GUI. They support 1 GSps LVDS I/O rates for both ADCs and DACs, enabling use with most TI ADC and DAC evaluation modules at maximum sample rates.
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