Test & Measurement


Signal integrity network analysers

30 May 2012 Test & Measurement

LeCroy announced the availability of 8- and 12-port models of the SPARQ series of signal integrity network analysers. The SPARQ makes S-parameter measurements quickly and is a fraction of the price of a vector network analyser (VNA). With the new 8- and 12-port models, signal integrity engineers can characterise crosstalk in multi-lane differential structures.

All SPARQ models utilise a built-in OSLT calibration kit to allow users to rapidly calibrate the analyser and measure the device under test, without using error-prone calibration standards that are external to the instrument. This means that a user can complete a full 12-port S-parameter measurement in approximately 30 minutes, with much of that time being unattended acquisition and calculation time.

Cloud computing, mobile computing, smartphones and streaming video applications are pushing the marketplace to deliver greater and greater network bandwidth. To meet this need, communication standards utilise multi-lane differential signalling to carry traffic at ever increasing bit rates. Multi-lane differential signalling has become pervasive, and is used in standards such as PCIe Gen3, Serial Rapid IO, InfiniBand and 40/100 G Ethernet.

More than ever, signal integrity issues due to crosstalk and channel effects such as inter-symbol interference lead to closed eyes and jitter. Signal integrity engineers find that they must attempt to both predict and understand these issues when designing multi-lane differential circuits and inter-connects to avoid design modifications and costly re-spins.

When using a network analyser with only four ports, signal integrity engineers can measure the S-parameters of only a single differential lane. While useful, these measurements only provide a partial understanding of circuit behaviour, and do not characterise the crosstalk between lanes. With the SPARQ-3012E, users can measure the complete 12-port S-parameter matrix in both single-ended and mixed-mode representations, at the click of a button.

The resulting S-parameters characterise the near-end (NEXT) and far-end (FEXT) crosstalk between up to three differential lanes, which can then be used in aggressor-victim-aggressor modelling in order both to predict circuit performance and to study transmitter and receiver equalisation schemes that may be required to open closed eyes.

The new SPARQ models are rated to 30 GHz end frequency, and can return S-parameter results out to 40 GHz. This makes them suitable for crosstalk measurements on a wide variety of commonly deployed high-speed multi-lane serial data standards.

For more information contact Comtest, +27 (0)11 608 8520, [email protected], www.comtest.co.za



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

High-speed AWG generates up to 20 sine waves
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.

Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.

Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.

Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.

Read more...
Companies collaborate on EnviroMeter
Avnet Silica Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.

Read more...
PCB test points
Vepac Electronics Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.

Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.

Read more...
Proximity sensor with VCSEL
Avnet Abacus Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.

Read more...
CNH data output devices for AI applications
Altron Arrow Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.

Read more...
Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.

Read more...