Agilent Technologies introduced what it believes is the world’s fastest vector signal generator in a PXI form factor.
The M9381A is a 1 MHz to 3 GHz or 6 GHz VSG that combines fast switching, high output power, linearity and level accuracy, elevated adjacent channel power ratio performance (for output levels up to +10 dBm or more) and wide modulation bandwidth (up to 160 MHz) for testing RF devices.
Agilent designed the M9381A for applications such as testing and validating the design of wireless power amplifiers and transceivers, public safety and military radios, and cellular base stations (primarily picocell and femtocell).
Agilent’s baseband-tuning technology innovation enables frequency and amplitude switching speed as fast as 10 μs in list mode and 250 μs from its programming interface.
The versatile list mode helps increase speed and provides flexibility by allowing engineers to change 80 parameters, including frequency, power and modulation in as many as 3201 list mode points. This enables engineers to meet a wide variety of test requirements while improving test throughput.
Engineers can use the instrument to test wideband power amplifiers, front-end modules, transceivers and more, at standard 40 MHz RF bandwidth or options of 100 MHz or 160 MHz bandwidth with real-time corrections and ±0,1, ±0,2 and ±0,3 dB flatness, respectively.
The M9381A can be used at power levels up to +10 dBm or more (depending on the standard) with little degradation to adjacent channel power ratio performance. This enables engineers to directly operate at the required power levels without additional amplification to compensate for test system losses.
The VSG delivers ACPR of up to -70 dBc (W-CDMA test model 1, 64 DPCH). The output power up to +19 dBm can be controlled precisely with accuracy of ±0,4 dB.
The M9381A simulates complex real-world communications signals through Agilent’s Signal Studio software, which is a flexible suite of signal-creation tools that offers performance-optimised reference signals validated by Agilent to support standards such as LTE and 802.11ac.
High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...E-mobility: Navigate safety, interoperability and conformance Concilium Technologies
News
In this whitepaper, these challenges are discussed in more detail and the question is asked: How can EV and EVSE manufacturers navigate a complex regulatory landscape and deliver a quality product, without compromising time-to-market projections?
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
printer friendly version