Agilent Technologies’ latest X-Series measurement application software provides comprehensive RF conformance testing of LTE-Advanced FDD and TDD transmitters and components to the 3GPP Release 11 specification. It is available for both benchtop and modular products.
LTE-Advanced is an evolutionary step in the continuing development of LTE. Appropriate test and measurement throughout the entire development lifecycle, however, remains critical to its successful proliferation. Agilent’s previously introduced LTE-Advanced signal analyser and signal generation solutions addressed these challenges at the R&D stage. Now, its embedded LTE-Advanced X-Series measurement application is addressing the test challenge during the design validation and manufacturing phases.
The new application provides one-button measurements for Agilent’s X-Series and modular signal analysers. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of operation, the application is ideally suited for design verification and manufacturing.
The solution enables comprehensive RF conformance testing of both contiguous and non-contiguous configurations of LTE-Advanced transmitters as defined by the 3GPP Release 11 specification. Specific measurements supported include transmitter characteristics testing of output power, transmitted signal quality, and unwanted emissions of both base stations and user equipment.
Also supported in the software is cumulative ACLR (CACLR) and cumulative spectrum emissions mask (SEM) measurements for intra-band non-contiguous carrier aggregation – a new requirement in 3GPP Release 11.
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