The new XJLink2-CFM and XJLink2-CFMx provide Teradyne users with integrated access to XJTAG’s powerful test and programming tools, operating under the control of the TestStation test program. With a JTAG solution installed internally to the TestStation in-circuit test (ICT) system, the complexity and recurring cost impact of fixture-based test can be significantly reduced, while improving overall test coverage.
Integrated Teradyne access gives users the power of advanced JTAG control using available slots on a Teradyne multi-function application board; use of the same tests in production line ICT and benchtop repair; in-system programming of Flash, FPGA and CPLD devices; and multi-protocol support including SPI and I²C.
The XJLink2-CFM is an advanced multi-TAP JTAG controller that fits into one of four custom function module (CFM) locations on the Teradyne multi-function application board. A single or multiple XJLink2-CFMs can be added to the same Teradyne card for supplementary test and program capabilities, for instance testing panels of boards.
XJLink2-CFMx expander cards are also available to maximise available connectivity from an XJLink2-CFM controller, from a maximum of eight fixture-connectable signals when just using the XJLink2-CFM, up to 18 signals by adding one, two or three XJLink2-CFMx cards.
The test interface of the XJLink2-CFM is completely configurable, allowing support for almost any programming protocol, not just JTAG devices. Programming speeds close to the theoretical maximum of a device can be achieved using the advanced features of the XJLink2-CFM.
The controller is compatible with the standard USB XJLink2, so boards can be debugged at a repair station without having to develop a separate test setup. Flexible licensing options also aid ease of use – the product can contain an XJTAG software licence and allow standalone operation without additional dongles or network access. The system can also be licensed from a network server, allowing the maximum use of XJTAG products without having to move licensed hardware between machines.
XJTAG offers a free trial and board setup to new users who are interested in taking an evaluation.
High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...PolarFire SoC Discovery Kit ASIC Design Services
DSP, Micros & Memory
By offering a user-friendly, feature-rich development kit for embedded processing and compute acceleration, Microchip is making emerging technology more accessible to engineers at all levels.
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
printer friendly version