The new LEM Flex III range of flexible AC current measurement probes ensures safe, accurate and nonintrusive measurements in applications that may be completely inaccessible with conventional current clamps and probes.
The probes provide a safe linear voltage output that is an exact replica of the input waveform for three user-selectable input current ranges of 30, 300 or 3000 A for the RR3020/RR3030 and 60, 600 and 6000 A for the RR6030. The standard 600 mm flexible head allows a measuring diameter of up to 190 mm. Larger measuring heads are available for the RR3030 and RR6030 models, with diameters up to 370 mm.
High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
Read more...Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.
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