Tektronix has introduced new optical modules for its DSA8300 sampling oscilloscope that feature extremely high mask test sensitivity and low noise, along with new features that increase production capacity and improve yield for current 100G designs moving into production.
The company also unveiled enhancements to its 400G test solution including IEEE Ethernet standard-driven Transmitter and Dispersion Eye Closure (TDECQ) PAM4 and related support measurements for optical testing.
When installed in DSA8300 sampling oscilloscopes, the new 80C17 and 80C18 optical modules provide mask test sensitivity of -14 dBm that exceeds requirements for 28 GBd PAM4 standards, while offering noise performance at 3,9 µW with broad wavelength support. The two-channel 80C18 enables optical manufacturing test engineers to double throughput and capacity.
If a device fails, Tektronix offers analysis tools to decompose the signal content for both noise and jitter to help engineers understand the underlying problem.
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