On offer from Comtest is the latest Tektronix DSA8300 digital sampling oscilloscope, with intrinsic jitter of less than 100 femtoseconds, providing comprehensive support for optical communications standards, time domain reflectometry and S-parameters.
The instrument is a complete high-speed PHY layer testing platform for data communications from 155 Mbps to 400 G PAM4. The electrical module signal measurement accuracy of <100 fs (ultra-low system jitter) enables the characterisation of high bit-rate (40 and 100 Gbps) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterisation of high bit-rate signals (fifth harmonic to data rates of 28 Gbps and third harmonic to data rates above 45 Gbps).
The DSA8300 has extremely low system noise at all bandwidths – 600 μV maximum @ 60 GHz; 380 μV maximum @ 30 GHz – so that the amount of instrumentation noise is minimised when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
High fidelity acquisition of multiple differential channels (up to six simultaneous acquisition at <100 fs jitter in a single mainframe) enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels. Optical modules support optical compliance test of all standard rates from 155 Mbps to 100 Gbps (4x25) Ethernet, providing a cost-effective and versatile optical test system for single- and multi-mode optical standards.
The DSA8300 provides high acquisition throughput with up to 300 KSps maximum sample rat. Remote sampling heads minimise signal degradation due to cabling and fixturing, simplifying test system de-embed. Having integrated, calibrated channel deskew in dual channel modules enhances signal fidelity for multi-channel measurements by eliminating skewing.
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