Test & Measurement


Board test and repair system

8 May 2002 Test & Measurement

Navatek Engineering specialises in advanced PC-based digital board testers and troubleshooting tools for processor-based boards. The company's NT5000 CPU Commander fits in a single PC slot and interfaces to the unit under test through one or more ROM sockets or clip-overs. Its monitor program takes control of the UUT and performs high-level test functions without the need for assembly or any other programming language. If needed, resident diagnostic code can be executed while the NT5000 CPU Commander is connected using its ROM overlay memory.

A Windows graphical user interface is included with built-in functions such as memory read, memory write, I/O read, I/O write which provide full access to the UUT. Higher level functions such as bus diagnostics, memory tests, memory move and copy operations can also be executed with a single command. A built in macro language supports easy development of complex test procedures without the need to learn a programming language. For custom test systems, the NT5000 CPU Commander can interface to any programming language capable of supporting DLLs such as Visual C, Visual Basic, Delphi, LabView and LabWindows.

To troubleshoot 'dead kernel' boards, the standard BusTest command is able to quickly identify any hardware or timing problems occurring on the boot path of the processor. An 8K deep trace buffer and a user-programmable breakpoint further enhance the NT5000's trouble-shooting capabilities. Other equipment such as an oscilloscope can be synchronised to any CPU bus cycle using the cross trigger bus. Finally, an optional logic probe is available to probe UUT nodes beyond the kernel. A powerful node test system allows known good responses from a reference UUT to be stored in a library for immediate comparison against the board under test. Selecting a node test automatically invokes the correct stimulus, captures the results and compares them against the reference library. A 'pass' or 'fail' message can be displayed or further instructions to the operator can be issued, pending the result of each node test.

The NT5000 CPU Commander supports all CPUs that boot from external ROM. The boot path width supported can be 8, 16 or 32 bits wide and both EPROM and flash-based designs can be supported. A boundary scan interface is provided to integrate other test methods.



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.

Read more...
Precise DC power analysis
Conical Technologies Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.

Read more...
What is a JTAG connector?
Spectrum Concepts Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.

Read more...
SIGLENT launches new 8 GHz DSO
Vepac Electronics Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.

Read more...
Multi-functional high-res oscilloscopes
Coral-i Solutions Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.

Read more...
TDK expands programmable PSU series
Accutronics Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.

Read more...
Analysing magnetic fields
Accutronics Test & Measurement
The engineers at Narda Safety Test Solutions have achieved a breakthrough in isotropic measurement and analysis of low-frequency magnetic fields in the form of their latest digital H-field probe.

Read more...
A new class of sampling scope
Comtest Test & Measurement
The PicoScope 9400A Series combines the huge analogue bandwidth of sampling oscilloscopes with the triggering architecture of real-time oscilloscopes.

Read more...
Single channel, programmable PSU
Electrocomp Express Test & Measurement
Rohde & Schwarz’ NGC101 is a NGC100-series power supply with a wide range of functions that make them ideal for use in development labs and industrial environments.

Read more...
Next-gen LineScan camera
Eagle Africa Technology Test & Measurement
New Imaging Technologies has launched the new LiSaSWIR, its next-generation SWIR LineScan camera and sensor.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved