Micro-sized grabber test clips
16 Feb 2000
Test & Measurement
Spescom Measuregraph
Pomona Electronics has available a new family of micro SMD grabber test clips, designed for testing fine pitch IC packages. These test clips are ideal for use in R&D labs for prototype design and debugging applications. Three grabber styles are offered including both short and long tip styles for 0,8 to 0,5 mm lead pitches and one for lead pitches as small as 0,3 mm. Small yet easy to handle, these grabbers can be used with virtually any fine pitch IC including QFP, PQFP, SSOP and TSOP and TSSOP packages claims Pomona.
Pomona's micro SMD grabbers offer a cost-effective and versatile solution when compared to higher priced multicontact test clips. Unlike multicontact clips which are limited to a single package style, these grabbers can be used on a variety of ICs. When a specific test clip is not readily available these grabbers will quickly attach to any IC lead, eliminating the need for labour intensive, potentially destructive soldering.
The micro SMD grabber's thin body design allows for side-by-side stacking for adjacent lead probing. The pincer tips are Teflon-insulated to guard against shorting. All styles can be used at frequencies up to 100 MHz and are supplied with flying leads for logic analyser attachment.
The addition of the new micro SMD grabber family enhances Pomona's already broad product offering of grabbers, grabber patch cords and IC test clips. Pomona claims it now offers the largest and most complete family of grabber test clips in the world, from the 1000 V IEC1010-rated Maxigrabber to the very tiny micro SMD grabber.
The micro SMD grabbers are available in packs of two or 10 pieces.
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