Anritsu Corporation has announced that its Signal Quality Analyzer-R MP1900A now supports the PCI Express 6.0 (PCIe 6.0) Base Specification Receiver Test (Rx test). As well as adding support for generating PCIe 6.0 Base Spec. Compliance Test patterns, the MP1900A-certified PCIe 3.0/4.0/5.0 tester now has an SKP function to filter SKP packets to support separate clock architecture (SRNS). This update offers customers an efficient test solution, meeting their design requirements by including automation software to calibrate the stressed test signal and measure jitter tolerance using real-time oscilloscopes from collaborating partners. As a result, one MP1900A now covers tests from PCIe 3.0 to PCIe 6.0.
Anritsu is continuing to develop future quality evaluation for PCIe equipment by actively proposing new technologies to PCI-SIG, and extending its tester functions with a focus on the PCIe 6.0 Base Spec. Compliance Test.
The spread of 5G services facilitating large data communications at high speeds is driving rapid evolution of new technologies, such as edge computing, IoT, and AI. At the same time, the internal interfaces of transmission equipment, servers, and storage in data centres forming the base of this technical revolution, are switching to the faster and larger-capacity PCIe standard.
The MP1900A is a high-performance bit error rate test (BERT) for Rx tests of high-speed computing and data communications interfaces including PCIe, USB, Thunderbolt, and 400/800GbE. Link Training and LTSSM functions are supported by a level PPG for high-quality waveforms, high-sensitivity input ED, high-accuracy jitter generation source (SJ, RJ, SSC, BUJ), and CM-I/DM-I, facilitating various applications, including compliance and margin tests together with troubleshooting.
Identifying interference in 5G and LTE networks
Test & Measurement
The latest Field Master software release provides a dual display of the LTE or 5G Frame structure, with automatic placement of gates on the Uplink slots alongside the RF spectrum of the gated time slots.
Read more...High-speed AWG generates up to 20 sine waves Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...Digitisers upgraded with pulse generator option Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...Companies collaborate on EnviroMeter Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...PCB test points Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...Proximity sensor with VCSEL Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...CNH data output devices for AI applications Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
printer friendly version