Technical Literature


Automated Test Summit Webcasts

11 November 2009 Technical Literature

National Instruments' sixth annual Automated Test Summit is now available to view on-demand. It provides a chance to learn how to apply proven methods from the top trends in test - software-defined instrumentation, multicore and parallel processing technologies as well as new methods for wireless and semiconductor test. Included are two keynotes - 'Top Trends Changing the Face of Automated Test in 2009' and 'Lean Innovation: Testing in a Tough Economy' - as well as more than 12 hours of on-demand training led by industry experts and over 25 short workshop sessions.

www.ni.com/testsummit





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