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Electronics Buyers' Guide

Electronics Manufacturing & Production Handbook 2017


 

Spectrometer measures Pb contamination
28 July 2004, Manufacturing / Production Technology, Hardware & Services

A novel instrument is being offered that promises accurate assessment of lead contamination as a quality-assurance measure in compliance with the RoHS and WEEE Directives. According to the maker, Fischer Instrumentation, its XRF pin diode spectrometer can measure with good accuracy, contamination in the 0,02-0,05% range. This means that the instrument can prove that the lead content is below the mandatory level, rather than simply showing that lead contamination is present, says the company.

X-ray Fluorescence: The primary X-radiation on specimen knocks electron out of an electron shell of an atom. An electron from a more distant shell ‘drops’ into the vacated space, emitting radiation with an energy that is characteristic of the particular element. Intensity determines its quantity
X-ray Fluorescence: The primary X-radiation on specimen knocks electron out of an electron shell of an atom. An electron from a more distant shell ‘drops’ into the vacated space, emitting radiation with an energy that is characteristic of the particular element. Intensity determines its quantity

For more information contact Fischer Instrumentation, 0944 1590 684100, mail@fishergb.co.uk


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