Everett Charles Technologies (ECT) recently launched a variety of new probe designs that offer threaded retention of the probe in the associated receptacle.
Conventional probes typically use detent to retain the probe in the receptacle. By nature, detents offer a strong insertion and extraction force that works ideally in most applications. However, in certain situations, if a probe plunger is released instantaneously, the velocity and mass of the plunger can actually overcome the retention force of the detents in the receptacle and cause the probe to ‘walk out’ of the receptacle upon repeated actuations.
The strong threaded attachment method of threaded probes prevents the probe from walking out of the receptacle. Threaded probes come in a variety of designs, including standard continuity, high-current and switch probes with a suite of tip styles for various interconnect needs. The associated receptacles can be press-fit, glued with epoxy, or soldered into test fixtures or connector housings.
Anritsu announce a test solution for PCIe 5.0 Coral-i Solutions
Test & Measurement
Granite River Labs and Anritsu Corporation have announced that their jointly developed PCI Express (PCIe) 5.0 automated test solution has been approved by PCI-SIG for “gold suite” product compliance testing.
Read more...Modbus probes gain support for parity options RF Design
Test & Measurement
The marquee feature of firmware version 1.06 facilitates the use of odd, even, mark or space parity modes when communicating with bus probes.
Read more...40 GHz RF power sensor Conical Technologies
Test & Measurement
Mini-Circuits’ PWR-40PW-RC is a USB/Ethernet-controlled power sensor capable of making many different measurements.
Read more...Power device analyser Concilium Technologies
Test & Measurement Power Electronics / Power Management
Keysight’s new PD1550A is an advanced double-pulse tester that enables customers to test entire power modules quickly and easily.