Test & Measurement

Threaded test probes

1 May 2013 Test & Measurement

Everett Charles Technologies (ECT) recently launched a variety of new probe designs that offer threaded retention of the probe in the associated receptacle.

Conventional probes typically use detent to retain the probe in the receptacle. By nature, detents offer a strong insertion and extraction force that works ideally in most applications. However, in certain situations, if a probe plunger is released instantaneously, the velocity and mass of the plunger can actually overcome the retention force of the detents in the receptacle and cause the probe to ‘walk out’ of the receptacle upon repeated actuations.

The strong threaded attachment method of threaded probes prevents the probe from walking out of the receptacle. Threaded probes come in a variety of designs, including standard continuity, high-current and switch probes with a suite of tip styles for various interconnect needs. The associated receptacles can be press-fit, glued with epoxy, or soldered into test fixtures or connector housings.


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