SPEA’s 3030 family of board testers can be equipped with up to four independent cores – each with independent CPU, local memory and instrumentation – making it possible to test in parallel up to four boards or panels. The same architecture has been applied to create a range of bed-of-nails as well as flying probe test systems.
A dual-stage option delivers different test techniques concurrently (e.g. in-circuit + functional, in-circuit + onboard programming, etc.), optimising the tests between the two stages and further reducing time and costs. In addition to automated application development capabilities, the 3030 family can be factory equipped or upgraded with all kinds of instrumentation useful for test environments. It is possible to integrate power instrumentation (AC/DC generators, active loads, power matrix etc.) as well as third-party instruments to increase test capabilities and productivity.
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