28 July 2004Manufacturing / Production Technology, Hardware & Services
Telecoms, Datacoms, Wireless, IoT
DiagnoSYS has signed an agreement with XJTAG, a specialist design and test tool developer, to enable it to integrate the XJTAG boundary scan development system into its PinPoint II advanced in-circuit tester. PinPoint II is a fast and economical in-circuit tester used for service departments, repair centres, and third party maintainers. This diagnostic tool can be used on almost any digital or hybrid circuit board for the diagnosis of faults down to component level, it says.
The XJTAG Development System provides a unique solution that can test JTAG as well as non-JTAG devices including ball grid array (BGA) and chip scale devices, SDRAMs, Ethernet controllers, video interfaces, flash memories, FPGAs, microprocessors and many other devices. XJTAG also enables in-system programming of FPGAs, CPLDs and flash memories.
Commenting on the agreement with XJTAG, Andy Bonner, business development director, DiagnoSYS, said: "We are now seeing a rapidly increasing number of boards with JTAG devices appearing at all points in the product lifecycle and therefore needed to find a boundary scan partner. We looked at all the major players and opted for the XJTAG system as it had the functionality we required, was priced competitively and integrated well with our own solutions.
"In addition, XJTAG's ability to offer In-System Programming of FPGAs and flash memories is a growing requirement from our customers, particularly those that want to program devices, such as mobile phones, during manufacture," added Andy Bonner. "The XJTAG system is also an excellent reverse engineering tool and we expect it to be popular for fault diagnosis in the repair environment where, often, we are working without any system diagrams."
DiagnoSYS has also signed a distribution agreement with XJTAG which will enable it to resell the complete XJTAG Development System via its global sales operation.
The XJTAG Development System provides a fully integrated environment, which can migrate seamlessly through the product life cycle from early design to field support and repair. XJTAG enables circuit designers to shorten the development cycle and prototyping process by facilitating early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits that utilise the same devices. XJTAG test scripts are also re-usable and portable across different boards due to the novel device-centric approach that the designers have adopted.
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