Automotive supplier saves by using NI software and PXI hardware
4 May 2005
Test & Measurement
Visteon, one of the world's largest suppliers of automotive systems and components, has adopted National Instruments' products including PXI modular instruments, NI TestStand test management software, LabWindows/CVI and NI-IMAQ vision software to reduce delivery time, costs and floor space in manufacturing.
"We standardised on NI software, including NI TestStand, LabWindows/CVI and NI-IMAQ, and replaced traditional rack-and-stack hardware with NI modular hardware, including PXI, data acquisition, switching, image acquisition and modular instruments," said Virgilio Salazar, Visteon R&D section supervisor. "With this new test system, we reduced our delivery time to our customers from eight to six weeks, with a record time of two weeks, due to software re-use. In addition, we saved more than $13 million and reduced floor space by more than 1300 square feet."
Visteon uses NI tools for automotive consumer electronics manufacturing test for its major automotive manufacturer customers. Due to the flexibility of the PXI platform, Visteon said it adopted one software and hardware platform for a customised, expandable system. The company uses a variety of PXI modular instruments, including the NI PXI-5411 function generator, the NI PXI-2503 multiplexer/matrix relay switch and the NI PXI-4070 FlexDMM, along with the NI PXI-8420 RS232 module and the NI PXI-1411 image acquisition module, to perform radio parametric testing, radio auto alignment testing and climate control parametric testing.
According to Visteon, the flexibility of the platform gives it the tools required to test a wide range of consumer electronics applications with a single modular platform. With the integration of LabWindows/CVI and NI TestStand, the company developed test sequences for different automotive components and also added instrument diagnostics and control tools to its proprietary software.
For more information contact NI South Africa, 0800 203 199.
Further reading:
High-speed AWG generates up to 20 sine waves
Vepac Electronics
Test & Measurement
Spectrum Instrumentation has released a new firmware option for its range of versatile 16-bit Arbitrary Waveform Generators, with sampling rates up to 1,25 GS/s and bandwidths up to 400 MHz.
Read more...
Digitisers upgraded with pulse generator option
Vepac Electronics
Test & Measurement
Spectrum Instrumentation has added the Digital Pulse Generator option to its ultrafast digitisers (with up to 10 GS/s speed) and arbitrary waveform generators.
Read more...
Network Master Pro to provide support of OpenZR+
Tamashi Technology Investments
Test & Measurement
Anritsu Corporation has introduced the 400G (QSFP-DD) multi-rate module MU104014B that supports the new interface standard.
Read more...
Upgrade brings extra layer of detection to Fluke’s acoustic imagers
Comtest
Test & Measurement
The firmware 5.0 update helps to boost efficiency and allows maintenance technicians to scan large areas quickly, and visually pinpoint technical issues before they become critical.
Read more...
Companies collaborate on EnviroMeter
Avnet Silica
Test & Measurement
STMicroelectronics and Mobile Physics have joined forces to create EnviroMeter for accurate air-quality monitoring on smartphones. Time-of-flight optical sensing enables an accurate personal air quality monitor and smoke detector.
Read more...
PCB test points
Vepac Electronics
Test & Measurement
Maintaining these access points in the final production versions will prove invaluable during the life of the equipment for service, adjustment, and debug, or repair activities.
Read more...
RFID reader
Test & Measurement
The EXA81 from Brady turns any smartphone or tablet into a personal radar that can pick up radio signals from all RFID-labelled items.
Read more...
Proximity sensor with VCSEL
Avnet Abacus
Test & Measurement
Vishay’s newest small package proximity sensor, the VCNL36828P, combines low idle current with an I2C interface and smart dual slave addressing.
Read more...
CNH data output devices for AI applications
Altron Arrow
Test & Measurement
STMicroelectronics’ CH family of time-of-flight sensor devices feature compact and normalised histogram (CNH) data output for artificial intelligence applications requiring raw data from a high-performance multizone ToF sensor.
Read more...
Webinar: The key to smart occupancy
Test & Measurement
This one-hour session will allow the attendee to discover the company’s latest infrared sensor with high-sensitivity presence and motion detection capabilities.
Read more...
printer friendly version