Test & Measurement


Benchtop AOI easily programmed

18 April 2007 Test & Measurement Infrastructure

YESTech's YTV B3 is an off-line benchtop PCB inspection automated optical inspection (AOI) system that uses advanced 'Thin Camera' technology to offer exceptional defect coverage. This benchtop system inspects solder joints and verifies correct part assembly enabling users to improve quality and increase throughput.

Programming the B3 is fast and intuitive. According to the company, operators typically take less than 30 minutes to create a complete inspection program including solder inspection. The B3 uses a standard package library to simplify training and ensure program portability across manufacturing lines. Programs created with the B3 are also compatible with YESTech's complete line of AOI systems.

Newly available Fusion Lighting and advanced image processing technology integrates several techniques, including colour, normalised correlation and rule-base algorithms, to provide complete inspection coverage with an extremely low false failure rate. The B3 is equally effective for pre/post-reflow or even final assembly inspection. Remote programming maximises machine utilisation and realtime SPC monitoring provides a valuable yield enhancement solution.

The YTV B3 AOI offers inspection for: solder and lead defects; component presence and position; correct part; polarity; through-hole parts; and paste.

For more information contact John Watson, Test & Rework Solutions, +27 (0)11 708 3451, [email protected]



Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

Software security is a team sport
Information Security Infrastructure
Building and maintaining secure software is not a one-team effort; it requires the collective strength and collaboration of security, engineering, and operations teams.

Read more...
New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.

Read more...
Precise DC power analysis
Conical Technologies Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.

Read more...
What is a JTAG connector?
Spectrum Concepts Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.

Read more...
Troye exposes the Entra ID backup blind spot
Information Security Infrastructure
If you trust Microsoft to protect your identity, think again. Many organisations naively believe that Microsoft’s shared responsibility model covers Microsoft Entra?ID – formerly Azure AD – but it does not.

Read more...
SIGLENT launches new 8 GHz DSO
Vepac Electronics Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.

Read more...
Multi-functional high-res oscilloscopes
Coral-i Solutions Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.

Read more...
Hytera supports communication upgrade for Joburg
News & Events Infrastructure Government and Parastatal (Industry)
By equipping Johannesburg’s metro police and emergency services with multimode radios which integrate TETRA and LTE networks, Hytera is bridging coverage gaps and improving response times across the city.

Read more...
TDK expands programmable PSU series
Accutronics Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.

Read more...
Analysing magnetic fields
Accutronics Test & Measurement
The engineers at Narda Safety Test Solutions have achieved a breakthrough in isotropic measurement and analysis of low-frequency magnetic fields in the form of their latest digital H-field probe.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved