Analog Devices has introduced three-axis MEMS accelerometers that perform high-resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks. The low power consumption of the new ADXL354 and ADXL355 lengthens battery life and allows extended product usage by reducing the time between battery changes.
The devices are designed to cost-effectively enable low-level vibration measurement applications such as structural health monitoring (SHM). Additionally, their tilt stability delivers excellent repeatability over temperature and time, which is ideal for orientation and navigation systems in unmanned aerial vehicles using inertial measurement units (IMUs) and inclinometers.
The accelerometers offer guaranteed temper-ature stability with null offset coefficients of 0,15 mG/C (max). This stability minimises resources and expense associated with calibration and testing efforts, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory.
With output of ±2 G to ±8 G full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25 μ/Hz at less than 200 μA current consumption, Analog Devices believes the ADXL354 and ADXL355 offer performance levels comparable to much more expensive devices, with less power consumption and BOM cost.
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