To help research and manufacturing engineers make precise and accurate measurement of frequency signals, including those generated by atomic clocks and other high-performance frequency reference modules and subsystems, Microchip Technology announced the availability of the new 53100A phase noise analyser.
The instrument is designed for engineers and scientists who rely on precise and accurate measurement of frequency signals generated for 5G networks, data centres, commercial and military aircraft systems, space vehicles, communication satellites and metrology applications.
Capable of measuring radio frequency (RF) signals up to 200 MHz, the new test instrument rapidly acquires frequency signals and characterises the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) quickly and precisely. All attributes of a frequency reference can be completely characterised with a single instrument within minutes.
The 53100A enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, enabling higher capacity for stability measurements. At 344 x 215 x 91 mm, it is small enough for integration into manufacturing automated test equipment (ATE) systems, yet powerful enough for laboratory-grade metrology. Its interface provides backward compatibility with Microchip’s 51xxA test sets’ command and data stream, reducing the need to redesign existing ATE infrastructure.
The analyser provides flexibility by allowing an input reference device to be connected through the front panel at a different nominal frequency than the device under test – allowing a single reference to characterise a variety of oscillator products. Rubidium frequency standards such as Microchip’s 8040C-LN or a quartz oscillator such as Microchip’s 1000C ovenised crystal oscillator (OCXO) could be used as a reference, as well as other manufacturers’ precise oscillators.
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