Test & Measurement


Test probes for the toughest test conditions

23 June 2021 Test & Measurement

Ingun has developed a test probe series especially for challenging contacting of tough OSP coatings, lead-free soldering or contaminated printed circuit boards (PCBs). Despite harsh conditions, these probes achieve outstanding test results. In addition to specially developed palladium-nickel coating, the E-Type Fusion series also boasts aggressive tip styles, an increased spring pre-load and Ingun’s tried and tested double beading.

The palladium-nickel coating, which was specially developed for the test probes in the E-Type Fusion series, differs from standard gold-plating due to its surface hardness being three times harder. This feature allows layers of residue and contamination such as OSP coating to be reliably penetrated.

The tip styles selected for the E-Type Fusion series are characterised by aggressive edges and excellent edge retention properties. In particular, the newly developed tip style 70 guarantees reliable contacting of OSP-coated test points without solder thanks to a particularly sharp-edged cutting geometry. The E-Type Fusion series is based on the tried-and-tested E-Type technology and enables reliable contacting of the PCB without additional stress. Ingun’s typical double beading ensures optimal hitting accuracy due to the precision guidance of plungers.


Credit(s)



Share this article:
Share via emailShare via LinkedInPrint this page

Further reading:

100ZR evaluation added to test instruments
Tamashi Technology Investments Test & Measurement
Anritsu Corporation has added 100ZR coherent optical transceiver evaluation to its portable Network Master Pro MT1040A/MT1000A testers, enabling comprehensive communication performance testing for the next-generation 100ZR standard.

Read more...
Multichannel digitisers
Vepac Electronics Test & Measurement
Spectrum Instrumentation has released new flagship digitisers with 12-bit resolution and a maximum of 6 channels at 10 GS/s or 12 channels at 5 GS/s acquisition speed.

Read more...
Aligning clocks over large distances
ASIC Design Services Test & Measurement
SkyWire technology from Microchip makes it easier to align and compare clocks within nanoseconds across geographic locations.

Read more...
Scalable power solutions up to 3 kW
Accutronics Test & Measurement
GAIA Converter has introduced the MGDM-500/P power module with a new parallel option for scalable power solutions up to 3 kW.

Read more...
New technique for measuring DNA damage could improve cancer therapy
Test & Measurement
Scientists at the National Institute of Standards and Technology have developed a new technology for measuring how radiation damages DNA molecules.

Read more...
Precise DC power analysis
Conical Technologies Test & Measurement
The ITECH IT2705 DC power analyser is designed to help engineers and researchers capture it all, from the tiniest deep sleep currents to the highest peak operating loads.

Read more...
What is a JTAG connector?
Spectrum Concepts Test & Measurement
JTAG was originally created to test for common problems, but lately, it has become a way of configuring devices.

Read more...
SIGLENT launches new 8 GHz DSO
Vepac Electronics Test & Measurement
SIGLENT has unveiled the enhanced SDS7000A/AP models, building on the success of its SDS7000A high-resolution digital oscilloscope series.

Read more...
Multi-functional high-res oscilloscopes
Coral-i Solutions Test & Measurement
RIGOL Technologies has launched two powerful additions to its oscilloscope portfolio that are tailored to meet the growing challenges of power electronics, automotive systems, and high-speed digital designs.

Read more...
TDK expands programmable PSU series
Accutronics Test & Measurement
With a 3U high chassis, the GAC and GAC-PRO provide extremely high-power density for a fully featured programmable AC power source.

Read more...









While every effort has been made to ensure the accuracy of the information contained herein, the publisher and its agents cannot be held responsible for any errors contained, or any loss incurred as a result. Articles published do not necessarily reflect the views of the publishers. The editor reserves the right to alter or cut copy. Articles submitted are deemed to have been cleared for publication. Advertisements and company contact details are published as provided by the advertiser. Technews Publishing (Pty) Ltd cannot be held responsible for the accuracy or veracity of supplied material.




© Technews Publishing (Pty) Ltd | All Rights Reserved